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熱電分析 / 霍爾效應 / 賽貝克效應

THERMOELECTRICS

  • can measure or determine the resistivity, Seebeck coefficient, ZT value and Hall coefficient
  • and gives you information about a conversion of waste heat into electrical energy and the quality of the thermoelectric material.
 
Devices:

TEG-TESTER

  • Measuring system for temperature-dependent efficiency evaluation of thermoelectric generators (TEGs)
  • Temperature range: RT to 300°C / -20 to 300°C
 

LSR-3

  • Measurement of Seebeck coefficient and electrical conductivity on solid materials and thin films
  • Temperature range: -100 to 500°C / RT to 800/1100/1500°C

LZT-METER

  • Combined LFA+LSR
  • Measurement of Seebeck coefficient, resistivity and thermal conductivity
  • Temperature range: -100 to 500°C / RT to 800/1100°C
  • For a complete ZT measurement
 

HCS 1/10/100

  • Characterization of semiconductor devices
  • Measures charge carrier mobility, resistivity, charge carrier concentration and Hall constant
  • Temperature range: LN2 to 800°C / RT to 500°C
 
 

TFA

  • Complete ZT characterization on thin films from nm to µm range
  • Optional measurement of Hall coefficient, carrier density and mobility
  • Temperature range: -170/RT to 280°C
 

TF-LFA

  • Time Domain Thermoreflectance (TDTR)
  • Measurement of the thermal diffusivity of thin films
  • Temperature range: -100/RT to 500°C
 
 
Links:
Product brochure as PDF:  
Video:
Linseis Thermoelectric devices - Basics (Webinar 2019)  
Application examples:
LSR – Copper – Electric conductivity TFA – thermoelectric thin film – thermoelectric properties – metals&alloys